YTV-M1-m

AOI

YTV-M1-m

AOI for Microelectronic Devices

YESTech's YTV-M1-m Automated Optical Inspection System for Microelectronic devices is a technological breakthrough that bridges the gap between expensive semiconductor AOI systems and low magnification PCB AOI systems. The M1-m is the fully automated solution for 100% inspection of devices in JEDEC trays, Auer boats, pallets and custom trays.

The M1-m is capable of detecting the following defects, and more:

	Missing Wires
	Wired Wrong
	No Stick
	Missing Bond
	Chipouts
	Damaged bond pads
	Wrong die
	Wrong orientation
	SMT components
	Wrong Polarity
	Cracked Die
	Contamination

The M1-m's user friendly software interface is intuitive and easy to use. Upon Defect Review, the Live Window points to the defect while the "Good" templates are displayed. The operator can classify defects using the customized Defect Classification Pull-Down list. The defects are then stored in a database (MS Access) and can be used to create SPC charts and Reports.

The M1-m utilizes YESTech's own FUSION^TM lighting to catch a wide range of defects.

Defect reports can be printed or stored electronically for use at a rework station. YESTech also offers Offline Review / Rework stations for paperless processing.

Other features include:

	OCR
	SPC software
	CAD translation software
	CAD import / export
	Barcode Reading
	Image Stitching
	Image collection & storage
	Auto Width Edge-belt conveyor
	Windows XP Pro^TM OS

For more information, please contact us at,

info@serteksales.com

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