The challenges of overhead sort testing demand unparalleled performance from your microscope system.  A system that helps you distinguish minute misalignments of probe tops to die.  To acquire a closer look at the alignment of that first critical die - the one you depend upon to establish an accurate inspection routine.

 

And with clock speeds approaching 100 MHz, and test devices with up to 512 pins, it's crucial to have precise probe placement on the die.

 

Only OPTEM International gives you the exclusively designed HF-65 and HF-165 Microscopes to meet your challenges, and to reduce set up time and test costs.  And most importantly, to ensure enhanced productivity.

 

The HF Microscopes offer higher magnification and resolution, as well as two advanced illumination systems for a clearer, more well-defined view than any stereo microscope commonly used on high frequency overhead sort test stations.  Our unique optical system lets you see high density probe cards more clearly than ever before.