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3D Automated Systems
ST2000 Series 3D Inspection and
Measurement Systems
Programmable Non-Contact XYZ Digital Video Technology
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Features Include:
 | Programmable X, Y & Z axes |
 | Programmable 12:1 Zoom Optics |
 | Programmable Lighting: Coaxial Brightfield
illumination, ring light, transmitted substage illumination and
incident light |
 | Automatic report generation |
 | Field-of-View measurements |
 | Stage-based measurements |
 | Auto Focus |
 | Stage travel from 4" to 48" |
 | XY Stage resolution: 0.1 - 5 micron |
 | Z-axis resolution: 0.1 - 2 micron |
 | Magnification range: 1X - 5000X |
 | Joystick &/or mouse control |
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High Resolution Zoom Optics
The ST2000 utilizes high resolution zoom optics combined with a
state-of-the-art video capture device to provide real-time, crisp,
detailed images. Our 12:1 programmable zoom system allows the
user to automatically, or manually zoom to the desired magnification
for a specific inspection or measurement task. The zoom is calibrated
throughout its entire range so, highly accurate field-of-view
measurements can be taken at any point in the zoom range. Sertek also offers several manual zoom modules including 7:1,
12.5:1, 16:1 and a 10:1 Telecentric Zoom. So, no matter what you
magnification requirements are, the ST2000 offers the solution.
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Large Field of view at high magnification
Our "Auto Mosaic" tool allows you to automatically
stitch together high-mag images into one large image. |
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Lighting is everything!
The ST2000 is equipped with programmable Brightfield "vertical"
illumination and Darkfield
"ringlight" illumination. The system can be expanded up
to 4 programmable illuminators for special applications.
Options include:
 | Brightfield/Darkfield |
 | Backlighting |
 | Oblique gooseneck lighting |
 | Fiber optic light lines for near horizontal surface illumination |
 | Fluorescent illumination |
 | UV light |
 | Focused light |
 | Polarization techniques |
Also available with manual control.
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SAMPLE MEASUREMENTS
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Semiconductor Die Pad Width @ 200X |
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Fluorescent Resinol Sample @ 30X |
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Flex-circuit Radius @ 50X
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Laser cut hole in film @ 100X |
Skewed Die Pad Width @ 150X |
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Weld Penetration @ 50X |


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Fluorescent Resinol Sample @ 30X
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Field of View
Measurements The ST2000
Series offers an incredible selection of field of view measurement
tools including:
 | Point-to-point |
 | Horizontal distance |
 | Vertical distance |
 | Distance between parallel lines |
 | Diameter, Radius |
 | Auto circle |
 | Area |
 | Auto Area |
 | Path length |
 | Distance between centers |
 | Area, Diameter & Radius of Thresholded Objects |
 | And more! |
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Stage-based Measurements
For measuring features outside the field of view, the ST2000
utilizes linear encoders for X, Y and Z measurements. Once again, we
configure your system to meet your needs. We offer encoders with
resolutions of 5 mm,
2mm,
1mm,
0.5mm
& 0.1mm.
The ST2000 also allows you to combine the field of view measurement
tools with stage-based measurements.
Z-axis
"Height" Measurements
Z-axis measurements are performed using the "focus method". By
focusing on two surfaces, the system can report the height between
the two. Utilizing a 0.1 micron linear encoder on the Z-axis and a
1.6 micron depth of field infinity corrected objective, the ST2000
is able to measure heights and depths with an accuracy of +/-2.5
microns. This will vary depending on your accuracy requirements as
well as your magnification specifications. Programmable, stepper
motor control makes the whole process automatic.
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